Overview
FAST Corner Detection is an image processing method that measures local image evidence and returns features, masks, segments, or restored pixels. It is useful when later vision steps need a compact feature, mask, or corrected image.
FAST Corner Detection detects repeatable local image features.
Compact metadata for implementation and discovery.
FAST Corner Detection is an image processing method that measures local image evidence and returns features, masks, segments, or restored pixels. It is useful when later vision steps need a compact feature, mask, or corrected image.
Quick facts
Runtime and memory behavior at a glance.
Best
O(p)
Average
O(p k)
Worst
O(p k)
Space
O(p)
Show the input image beside the response map, mask, or transformed output.
FAST Corner Detection operates in O(p k) time and O(p) space within the Image Processing family. Often compared with Harris Corner Detection and Shi-Tomasi Corner Detection.
What each reference supports for this entry.
Reference for FAST high-speed corner tests on circular pixel neighborhoods.
Open sourceComputer-vision textbook support for FAST Corner Detection's feature, matching, flow, or multiscale image-analysis workflow.
Open sourceGood next jumps from the relationship graph, ranked for useful discovery.
Image Processing · Core
FAST Corner Detection extracts or transforms image evidence differently than Harris Corner Detection.
Compare with thisFAST Corner Detection extracts or transforms image evidence differently than Harris Corner Detection.